SAE J1752/3

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit Radiated Emissions Measurement Procedure 150 kHz to 1000 MHz, TEM Cell

Org/Number ID	SAE J1752/3
Alternate Organization ID / number
Version(s)	1995, 2003
Bin #	0349
Comments	Title Change for 2003 version: (R) Measurement of Radiated Emissions from Integrated Circuits - TEM/Wideband TEM (GTEM) Cell Method: TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)
Status	Present
Record last updated	May 17, 2022, 8:13 pm

This is not the most recent edition of this standard.

Newer edition note: 2017