SAE J1752-2
Electromagnetic compatibility measurement Procedures for Integrated Circuits - Integrated Circuit Radiated Emissions Diagnostic Procedure 1 MHz to 1000 MHz, Magnetic Field - Loop Probe
| Org/Number ID | SAE J1752-2 |
|---|---|
| Alternate Organization ID / number | |
| Version(s) | 1995, 2003 |
| Bin # | 0349 |
| Comments | Title Change for 2003 version: (R) Measurement of Radiated Emissions from Integrated Circuits - Surface Scan Method (Loop Probe Method) 10 MHz to 3GHz |
| Status | Present |
| Record last updated | May 17, 2022, 8:10 pm |
This is not the most recent edition of this standard.
Newer edition note: 2016